China High Stability Scanning Electron Microscope Equipment - China Supplier
China High Stability Scanning Electron Microscope Equipment - China Supplier China High Stability Scanning Electron Microscope Equipment - China Supplier

High Stability Scanning Electron Microscope Equipment

Price:Negotiable
Industry Category: Measurement-Analysis-Instruments
Product Category:
Brand: 中图仪器
Spec:


Contact Info
  • Add:深圳市南山区西丽学苑大道1001号智园B1栋二楼, Zip: 518071
  • Contact: 罗健
  • Tel:0755-83318988
  • Email:sales@chotest.com

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Description
Additional Information

Zhongtu Instruments' High-Stability Scanning Electron Microscope Equipment features a compact desktop design that is not constrained by space limitations, offering true spatial adaptability. Users can even place it conveniently on their own desks. The tungsten filament electron gun used is relatively simple to control and easy to operate, requiring no specialized or lengthy training to master basic operational skills. It is suitable for a wide range of users, especially beginners or non-professional technicians with limited experience in electron microscope operation, allowing them to quickly familiarize themselves with and use the equipment for relevant testing and research work.

Product Features

1) The compact desktop design of the CEM3000 series desktop scanning electron microscope ensures it is not limited by space constraints, offering true spatial adaptability. Users can even place it conveniently on their desks. Additionally, the CEM3000 can be easily relocated according to user needs, making it versatile for multiple locations;

2) High resolution enables observation and analysis of micro-scale features, meeting users' observation requirements;

3) Fast pumping and venting, thanks to the vacuum system design, reduces waiting time for users;

4) High usability allows for rapid imaging and one-click image capture. Users can utilize automatic adjustment functions to obtain high-quality images with minimal manual intervention;

5) Large sample chamber: The CEM3000A, while maintaining a compact size, features a chamber comparable to upright electron microscopes, accommodating larger samples;

6) High vibration and magnetic resistance: The entire series boasts excellent anti-interference capabilities. The CEM3000B, in particular, uses proprietary technology and composite vibration resistance methods to elevate vibration resistance to new heights;

7) Optional low vacuum mode allows users to set the vacuum level in the sample chamber as needed for observing different types of samples;

8) Offers multiple imaging parameters for users to choose from, meeting the adjustment needs of professional users;

9) Equipped with various probes for multi-method sample analysis.

Application Fields

The High-Stability Scanning Electron Microscope Equipment features a compact design with strong spatial adaptability. The entire system incorporates extensive anti-interference design to minimize environmental impacts, broadening its application scope. Additionally, this series of desktop electron microscopes offers rich automatic adjustment functions, enabling observation of various sample types with high spatial resolution.

Users can equip the CEM3000 series large-chamber desktop scanning electron microscope with different probes to simultaneously receive multiple signals for sample analysis.

Product Models

Zhongtu Instruments CEM3000A (Large Sample Chamber Type): 70mm×70mm sample chamber, compatible with large-sized or batch sample analysis.

Zhongtu Instruments CEM3000B (Vibration-Resistant Type): Specifically designed for vibrating environments, with faster pumping (low vacuum in just 40 seconds) and more stable imaging.


Application Cases

The High-Stability Scanning Electron Microscope Equipment offers high usability with rapid imaging and one-click image capture, requiring minimal manual adjustment. It features ultra-high resolution better than 4nm (SE) and 8nm (BSE) @20kV,超大景深毫米级别景深, and high spatial resolution.

Metal Material Analysis

Pollen Microstructure

Partial Technical Specifications

Model

CEM3000A (Large Sample Chamber Type)

Electron Gun

Filament

Tungsten Filament

Resolution

Better than 4nm (SE), Better than 8nm (BSE)  @20kV

Accelerating Voltage

1 ~ 20kV

Magnification

Electron Image: 40 ~ 200,000× (Optional Large Image Stitching)

Detector

Secondary Electron

Standard

Backscattered Electron

Standard (Quadrant High-Resolution Probe)

Energy Dispersive Spectrometer

Optional

Automation Software

Standard: Auto Alignment, Auto Focus, Auto Stigmation, One-Click Image Enhancement

Optional: Particle Size Statistics, Porosity Measurement, Fiber Measurement, 3D Roughness Reconstruction

Vacuum System

Vacuum Level

High Vacuum: Better than 9×10-3Pa

Low Vacuum: 5 ~ 100 Pa (Optional)

Pumping Time

Low Vacuum Mode  < 1.5min

High Vacuum Mode  < 3min

Sample Stage

Automatic Axis

X, Y, T

Manual Axis

R, Z

Travel Range

X: 50mm

Y: 50mm

R: 0°~360° (Manual Rotation, Electron Beam Rotation)

T: -22.5°~ +22.5°

Z: 45mm


Maximum Sample Size

70mm×70mm (Horizontal)

45mm (Height)

In-Chamber Camera

Navigation Camera

Standard High-Resolution Color Camera

Side View Camera

Standard High-Resolution Infrared Camera

Operating System

Image Size

Windows10 (64bit)

640×480

1280×960

2560×1920

5120×3840

10240×7680

Please note: Due to market developments and product development needs, the content in this product documentation may be updated or modified at any time based on actual circumstances without prior notice. We appreciate your understanding for any inconvenience caused.

If you have any questions or need more detailed information, please feel free to contact Zhongtu Instruments for consultation.

Industry Category Measurement-Analysis-Instruments
Product Category
Brand: 中图仪器
Spec:
Stock: 99
Manufacturer:
Origin: China / Guangdong / Shenshi
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